New Methods for Calibrated Scanning Thermal Microscopy (SThM)

A batch microfabricated scanning thermal microscopy (SThM) probe is presented. The sensor, based on a Pd resistance thermometer is shown to be suitable for calibration and stable for very long periods (> 700 hours). A technique for achieving transformer isolation of the SThM probe is described and shown to be a highly effective route to obtaining calibrated SThM scans of electrically sensitive samples as well as those subject to large bias voltages.

Dobson, P. S., Weaver, J. M., & Mills, G. (2007, October). New methods for calibrated scanning thermal microscopy (SThM). In Sensors, 2007 IEEE (pp. 708-711). IEEE.

Share this post

Connect with us
Stay informed of our latest innovations, sign up to our newsletter.

News & Events

DFB InP Process Scaled to 150 mm (6”) 

Kelvin Nanotechnology (KNT) has developed a Distributed Feedback (DFB) grating process on 150 mm (6”) InP platform. The work was done in collaboration with the James Watt Nanofabrication Centre (JWNC) and IQE plc (Cardiff, Wales).

Read More »

How can we help you to bring your project together?