QUANTIHEAT project: Main progresses
The development of increasingly complex and nanostructured materials and devices, for example thermoelectric materials, nanocomposite polymers or micro- and nanosystems (microelectronics systems, MEMS/NEMS),
The development of increasingly complex and nanostructured materials and devices, for example thermoelectric materials, nanocomposite polymers or micro- and nanosystems (microelectronics systems, MEMS/NEMS),
Quantitative thermal measurements with spatial resolution allowing the examination of objects of submicron dimensions are still a challenging task. The quantity of methods
The thermal resistance along the thickness of In3SbTe2 crystalline nanowires was measured using the scanning thermal microscopy in 3ω mode. The nanowires were grown by
Scanning thermal microscopy (SThM), which enables measurement of thermal transport and temperature distribution in devices and materials with nanoscale resolution is rapidly becoming
Nanoscale solid-solid contacts define a wealth of material behaviours from the electrical and thermal conductivity in modern electronic devices to friction and losses
The use of scanning thermal microscopy (SThM) and Kelvin probe force microscopy (KPFM) to investigate silicon nanowires (SiNWs) is presented. SThM allows imaging
This paper presents experimental results of quantitative DC measurements carried out by the use of a scanning thermal microscope equipped with nanofabricated thermal
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